Search Results - soft+error

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2021-400 COMET: On-Die and In-Controller Collaborative Memory ECC Technique for Stronger and Safer Correction of DRAM Errors
Summary: UCLA researchers in the Department of Electrical and Computer Engineering have developed a method titled Collaborative Memory ECC Technique (COMET), to efficiently detect two error correcting codes (ECC) and eliminate silent data corruption (SDC) when double-bit errors occur within DRAMs. Background: Technological abundance has been the...
Published: 12/11/2023   |   Inventor(s): Puneet Gupta, Irina Alam
Keywords(s): Analogue Electronics, Big Data, Data Corruption, DDR3 SDRAM, DDR4 SDRAM, Random-Access Memory, Semiconductor, Semiconductor Device, Soft Error, Software
Category(s): Electrical, Electrical > Electronics & Semiconductors, Materials > Semiconducting Materials, Energy & Environment > Energy Storage
A Fault Tolerant Compiler for Zero Silent Data Corruption
Soft errors, such as transient faults caused by alpha particles or cosmic rays, can alter signal transfers or stored data in microprocessors. As a result, these soft errors often cause incorrect program execution or “glitches”. The exponentially growing rate of soft errors makes reliability a top priority in modern processor design. While...
Published: 2/23/2023   |   Inventor(s): Moslem Didehban, Aviral Shrivastava
Keywords(s): Fault tolerance, Reliability, Soft error, Transient Fault
Category(s): Computing & Information Technology, Physical Science