Search Results - moslem+didehban

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Effective Triplication for Flexible and Real-Time Soft Error Resilience
­Background The increasing use of digital systems in everyday life has made reliability a key factor in the design of modern microprocessors. Soft errors are caused by high-energy particles, power supply noises, transistor variability, and can modify the logic value stored in microprocessor memory elements, which can cause a timing or functional...
Published: 2/23/2023   |   Inventor(s): Moslem Didehban, Aviral Shrivastava, Sai Ram Dheeraj Lokam
Keywords(s):  
Category(s): Medical Devices, Computing & Information Technology, Wireless & Networking, Physical Science
Extremely Lightweight Checkpoint Method for Resilience Against Soft Errors
Background Soft errors or transient faults—caused by high-energy particles that lead to an unexpected change in the transistor logic—have long been considered the main reliability challenge for many mission-critical applications. Conventionally, hardware-level soft-error resilience techniques have been employed in mission- and safety-critical...
Published: 2/23/2023   |   Inventor(s): Moslem Didehban, Aviral Shrivastava, Sai Ram Dheeraj Lokam
Keywords(s):  
Category(s): Physical Science, Computing & Information Technology, Intelligence & Security
A Fault Tolerant Compiler for Zero Silent Data Corruption
Soft errors, such as transient faults caused by alpha particles or cosmic rays, can alter signal transfers or stored data in microprocessors. As a result, these soft errors often cause incorrect program execution or “glitches”. The exponentially growing rate of soft errors makes reliability a top priority in modern processor design. While...
Published: 2/23/2023   |   Inventor(s): Moslem Didehban, Aviral Shrivastava
Keywords(s): Fault tolerance, Reliability, Soft error, Transient Fault
Category(s): Computing & Information Technology, Physical Science