Search Results - lawrence+clark

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Reverse Body Bias for Improved Integrated Circuit Total Ionizing Dose Response
It is possible to fabricate radiation-hardened circuits using commercially available, state-of-the-art CMOS manufacturing processes via novel applications of Radiation Hardening by Design (RHBD) techniques. RHBD techniques allow users to mitigate total ionizing dose (TID) effects caused by layout techniques while being able to handle single...
Published: 2/23/2023   |   Inventor(s): Lawrence Clark, Karl Mohr, Keith Holbert
Keywords(s):  
Category(s): Physical Science, Semiconductor Devices
Structures and Methods for Design Automation of Radiation Hardened Triple Mode Redundant Digital Circuits
Protecting high performance integrated circuits (ICs) from ionizing radiation induced upset is a key issue in the design of microcircuits for applications such as spacecraft, high altitude aircraft, and around nuclear accidents or nuclear warfare. A radiation induced soft error occurs in a semiconductor device when a high-energy particle travels...
Published: 2/23/2023   |   Inventor(s): Lawrence Clark, Nathan Hindman, Dan Wheeler Patterson
Keywords(s):  
Category(s): Advanced Materials/Nanotechnology, Physical Science
Pulse-Clocked TMR Flip-Flop Design for Efficient Temporal Radiation Hardening of Digital Circuits
Digital circuits use sequences of logic gates called flip-flops (FFs) to store and transmit binary information. Triple mode redundant (TMR) FFs have three logic gates that produce a single output based on their majority state in case one fails due to soft error. A soft error occurs when a switch within a digital circuit flips to its opposite state,...
Published: 2/23/2023   |   Inventor(s): Lawrence Clark
Keywords(s): Integrated Circuits, Ionizing Radiation, Radiation Hardening
Category(s): Semiconductor Devices
Secure true random number generation using 1.5-T transistor flash memory
Flash memory and true random number generators (TRNGs) can be essential components of security systems for smart devices. Using physical variations in integrated circuit (IC) constituent components is an increasingly popular technique for generating true random numbers. An existing approach uses a technique called “partial programming” to...
Published: 2/23/2023   |   Inventor(s): Lawrence Clark, Keith Holbert, James Adams
Keywords(s): Electronics, Fingerprint, True Random Number Generation
Category(s): Applied Technologies, Computing & Information Technology, Physical Science, Semiconductor Devices, Semiconductors, Materials & Processes
Multi-Mode Radiation Hardened Multi-Core Microprocessors
Integrated circuits (ICs) are used to produce the digital circuits needed for processing binary information. There are two main errors that can occur in ICs. First, hard errors result in permanent failure to the module. Second, soft errors occur when a binary switch within a digital circuit flips to its reverse state causing the IC to receive an incorrect...
Published: 2/23/2023   |   Inventor(s): Lawrence Clark
Keywords(s):  
Category(s): Semiconductors, Materials & Processes
Muller C-element as majority gate for self-correcting triple modular redundant logic
Technology scaling has increased the susceptibility of integrated circuits (ICs) to experience an incorrect signal (soft error). Triple modular redundancy (TMR) is a type of code that sends a message through a circuit three times in order to determine the most probabilistic value and hence, mitigate soft error. Circuits using TMR logic in aerospace...
Published: 2/23/2023   |   Inventor(s): Lawrence Clark, Srivatsan Chellappa, Aditya Gujja, Vinay Vashishtha
Keywords(s):  
Category(s): Computing & Information Technology, Physical Science, Semiconductor Devices, Semiconductors, Materials & Processes
Design Automation of Radiation Hardened Mixed Single, Dual, and Triple Mode Redundant Digital Circuits
The fundamental building blocks of all computer electronics, integrated circuits (ICs) are the least expensive way to create the digital circuits needed for processing binary information. A soft error is when a binary switch within a digital circuit flips to its opposite state and causes an electronic device to malfunction. Modular redundancy is a method...
Published: 2/23/2023   |   Inventor(s): Lawrence Clark, Dan Wheeler Patterson, Chandarasekaran Ramamurthy, Srivatsan Chellappa
Keywords(s): Circuits, Integrated Circuits, Ionizing Radiation, Radiation Hardening
Category(s): Semiconductor Devices
Low complexity Out-of-Order Issue Logic using Static circuits
Instruction-level parallelism (ILP) is a measure of how many of the operations in a computer program can be performed simultaneously. Superscalar techniques based on extracting instruction-level parallelism have been a major contribution to high performance microprocessor design throughout the last decade. The number of instructions executed...
Published: 2/23/2023   |   Inventor(s): Lawrence Clark, Siddhesh Mhambrey, Satendra Maurya
Keywords(s): Logic, Synthesis
Category(s): Semiconductor Devices, Semiconductors, Materials & Processes
Fast Parallel Test of SRAM Arrays
Static random access memory (SRAM) is used extensively in modern integrated circuits, comprising over 90% of the transistor count in server microprocessors. Over the past couple decades, technology has aggressively scaled down integrated circuit components, quickly entering the nanoscale. At this scale of manufacturing, there is inevitably an increase...
Published: 2/23/2023   |   Inventor(s): Lawrence Clark, Yu Cao
Keywords(s):  
Category(s): Applied Technologies, Computing & Information Technology, Semiconductor Devices, Wireless & Networking, Diagnostic Assays/Devices
Improved SRAM Circuits for Integrated Circuit Identification Using Mismatch Fingerprint
There is a continuing need for high-level device security to transfer information on penetrable channels, track the device and data, and encrypt valuable data, whether for national security purposes, intellectual property, or company and individual privacy. Obtaining a unique signature for an integrated circuit can be an excellent tool to achieve...
Published: 2/23/2023   |   Inventor(s): Lawrence Clark, Srivatsan Chellappa
Keywords(s):  
Category(s): Computing & Information Technology, Physical Science
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