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Structures and Methods for Design Automation of Radiation Hardened Triple Mode Redundant Digital Circuits
Protecting high performance integrated circuits (ICs) from ionizing radiation induced upset is a key issue in the design of microcircuits for applications such as spacecraft, high altitude aircraft, and around nuclear accidents or nuclear warfare. A radiation induced soft error occurs in a semiconductor device when a high-energy particle travels...
Published: 2/23/2023   |   Inventor(s): Lawrence Clark, Nathan Hindman, Dan Wheeler Patterson
Keywords(s):  
Category(s): Advanced Materials/Nanotechnology, Physical Science