Search Results - ionizing+radiation

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Assays for Measuring and Quantifying DNA Damage
Abstract: Exposure to ionizing radiation or agents that induce DNA double-stranded breaks (DSBs), which is one of the most damaging types of lesions in DNA, can result in damage to cells and/or tissues.  Thiscan lead to illness (i.e., Acute Radiation Syndrome, Cancer) or death.  Identifying the amount of exposure to a DNA DSB-causing agent can be useful...
Published: 4/8/2024   |   Inventor(s): Christophe Redon, Yiping Zhang, William Bonner, Jiuping ("Jay") Ji
Keywords(s): and environmental agents, chemotherapeutic agents, DNA damage, ionizing radiation
Category(s): Application > Diagnostics, Collaboration Sought > Collaboration, TherapeuticArea > Oncology, Collaboration Sought > Licensing
Pulse-Clocked TMR Flip-Flop Design for Efficient Temporal Radiation Hardening of Digital Circuits
Digital circuits use sequences of logic gates called flip-flops (FFs) to store and transmit binary information. Triple mode redundant (TMR) FFs have three logic gates that produce a single output based on their majority state in case one fails due to soft error. A soft error occurs when a switch within a digital circuit flips to its opposite state,...
Published: 2/23/2023   |   Inventor(s): Lawrence Clark
Keywords(s): Integrated Circuits, Ionizing Radiation, Radiation Hardening
Category(s): Semiconductor Devices
Design Automation of Radiation Hardened Mixed Single, Dual, and Triple Mode Redundant Digital Circuits
The fundamental building blocks of all computer electronics, integrated circuits (ICs) are the least expensive way to create the digital circuits needed for processing binary information. A soft error is when a binary switch within a digital circuit flips to its opposite state and causes an electronic device to malfunction. Modular redundancy is a method...
Published: 2/23/2023   |   Inventor(s): Lawrence Clark, Dan Wheeler Patterson, Chandarasekaran Ramamurthy, Srivatsan Chellappa
Keywords(s): Circuits, Integrated Circuits, Ionizing Radiation, Radiation Hardening
Category(s): Semiconductor Devices