Search Results - sai+ram+dheeraj+lokam

2 Results Sort By:
Effective Triplication for Flexible and Real-Time Soft Error Resilience
­Background The increasing use of digital systems in everyday life has made reliability a key factor in the design of modern microprocessors. Soft errors are caused by high-energy particles, power supply noises, transistor variability, and can modify the logic value stored in microprocessor memory elements, which can cause a timing or functional...
Published: 2/23/2023   |   Inventor(s): Moslem Didehban, Aviral Shrivastava, Sai Ram Dheeraj Lokam
Keywords(s):  
Category(s): Medical Devices, Computing & Information Technology, Wireless & Networking, Physical Science
Extremely Lightweight Checkpoint Method for Resilience Against Soft Errors
Background Soft errors or transient faults—caused by high-energy particles that lead to an unexpected change in the transistor logic—have long been considered the main reliability challenge for many mission-critical applications. Conventionally, hardware-level soft-error resilience techniques have been employed in mission- and safety-critical...
Published: 2/23/2023   |   Inventor(s): Moslem Didehban, Aviral Shrivastava, Sai Ram Dheeraj Lokam
Keywords(s):  
Category(s): Physical Science, Computing & Information Technology, Intelligence & Security