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In Situ Electromigration Testing Fixture for X-Ray Microtomography Systems & Electron Microscopes
Electromigration is the transport of material caused by an uneven distribution of current, causing atoms to accumulate at the anode and separate from the cathode of an electronic circuit. Materials that experience electromigration undergo a complex 3D evolution, which often results in short and open circuit failures at soldering joints. Electromigration’s...
Published: 2/13/2025   |   Inventor(s): Nikhilesh Chawla, James Mertens
Keywords(s): Algorithm Development, Electronics, Manufacturing, Materials and Electronics, Mechanical and Manufacturing, Medical Devices and Imaging, Modeling, Nephrology, Software
Category(s): Semiconductors, Materials & Processes