Search Results - deepesh+sahoo

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TIDE: Telemetry-Informed Delay Testing for Silent Data Corruption
Invention Description Silent data corruptions (SDCs) are particularly difficult to detect because they produce incorrect computational results without generating warnings or system errors. A primary cause of SDCs is voltage droop, a transient reduction in supply voltage that can induce timing violations along critical signal paths. Conventional testing...
Published: 7/21/2026   |   Updated: 7/21/2026   |   Inventor(s): Eduardo Ortega, Krishnendu Chakrabarty, Farshad Firouzi, Deepesh Sahoo
Keywords(s):  
Category(s): Physical Science
LLM-Aided In-Field Workload Generation for Detecting Silent Data Corruptions at Scale
Invention Description As semiconductor devices continue to increase in complexity, large-scale computing systems face growing risks of silent data corruptions (SDCs), which produce incorrect computational results without triggering conventional error detection mechanisms. Traditional post-manufacturing testing approaches are often costly, inefficient,...
Published: 7/21/2026   |   Updated: 7/21/2026   |   Inventor(s): Peter Domanski, Krishnendu Chakrabarty, Farshad Firouzi, Deepesh Sahoo, Eduardo Ortega
Keywords(s):  
Category(s): Physical Science