Resolution Maps for Configuring Contacts in Electrical Impedance Tomography

NU 2024-207

Inventors
Michael A. Grayson
Jessie M. Sheflin
Claire C. Onsager

Description:
Resolution maps introduce a novel analysis method in the field of Electrical Impedance Tomography (EIT) by quantifying the precision and accuracy of image reconstructions across different regions within the area of interest. This technique employs a projection operator to map individual mesh elements of the conducting area into a basis of orthogonal functions, representing the data space of chosen measurements. By evaluating these projections against three key figures of merit - mean displacement, radial standard deviation, and ellipticity, resolution maps provide a visual and quantitative comparison of different measurement sets and electrode configurations, as well as the resolution variability within the same mesh.

Problems Solved:

• Difficulties in quantifying and comparing the precision and accuracy of EIT image reconstructions.
• Challenges in optimizing EIT setups for specific diagnostic or imaging requirements.
• Limitations in assessing the impact of electrode placement and measurement selection on EIT resolution.

Key Advantages:

• Enables precise quantification of EIT measurement precision and accuracy.
• Facilitates comparison between different electrode geometries and measurement sets.
• Allows for targeted optimization of EIT setups for specific regions of interest.
• Improves the reliability of EIT in diagnosing and imaging various organs by optimizing electrode placement and data measurement.

Market Applications:

• Real-time medical imaging for diagnostic purposes, including organ and tissue visualization.
• Industrial and engineering applications requiring accurate internal imaging of conducting materials.

IP Status:
Provisional Patent Application Filed