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Robust Slope Detection Technique for STTRAM and MRAM Sensing

Competitive Advantages Low overhead cost Increased sensing robustness Eliminates process variation Summary USF inventors have developed a new slope detection technique to exploit MTJ resistance switching from the high to low state. This technique can reduce or eliminate bit-to-bit process variation, and the need for data and reference...

Published: 8/25/2023 | Inventor(s): Seyedhamidreza Motaman, Swaroop Ghosh

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Category(s): Technology Classifications > Electronics