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MICROSCOPE INCLUDING INTERFEROMETER
VALUE PROPOSITION This technology lies in its ability to provide high-quality, 3D imaging of samples with significant surface offsets from a nominal plane, while maintaining spatial resolution. By employing a microscope with an interferometer and utilizing single-shot, polarization-sensitive detection this system offers advantages over conventional...
Published: 6/30/2026   |   Updated: 6/30/2026   |   Inventor(s): Marcos Dantus, Sergei Anishchik
Keywords(s):  
Category(s): Nanotechnology, Photonics, Test and Measurement