Search Results - semiconductor+metrology

1 Results Sort By:
Solid-State Spatiotemporal Overlap Diagnostic for Electron and Laser Beams
Background Electron accelerators are used in a number of applications, from medical imaging by x-ray production, to gamma-ray production for medical applications. Integrating high-power lasers and electron beams can potentially improve the performance of electron accelerators, make compact x-ray sources, and potentially create new kinds of light. However,...
Published: 12/10/2024   |   Inventor(s): Samuel Teitelbaum, Mark Holl, Sean Tilton, William Graves
Keywords(s): Medical Devices and Imaging, Semiconductor Metrology, Semiconductor Processing
Category(s): Physical Science, Medical Imaging, Applied Technologies, Advanced Materials/Nanotechnology