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Search Results - nidish+vashistha
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Scanning Electron Microscope Search Algorithm That Locates Defects or Trojans in Integrated Circuits
Applies Object Localization Algorithm to Identify and Locate Objects in Large, Complex Images This object localization algorithm and window search technique identifies and locates target objects from scanning electron microscope images of integrated circuits to assist detection of defects and malicious circuits. Integrated circuits play key roles...
Published: 12/9/2021
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Inventor(s):
Damon Woodard
,
Mark Tehranipoor
,
Navid Asadi-Zanjani
,
Ronald Wilson
,
Hangwei Lu
,
Nidish Vashistha
Keywords(s):
Category(s):
Technology Classifications > Engineering > Computer Science