Search Results - nidish+vashistha

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Scanning Electron Microscope Search Algorithm That Locates Defects or Trojans in Integrated Circuits
Applies Object Localization Algorithm to Identify and Locate Objects in Large, Complex Images This object localization algorithm and window search technique identifies and locates target objects from scanning electron microscope images of integrated circuits to assist detection of defects and malicious circuits. Integrated circuits play key roles...
Published: 1/20/2026   |   Inventor(s): Damon Woodard, Mark Tehranipoor, Navid Asadi-Zanjani, Ronald Wilson, Hangwei Lu, Nidish Vashistha
Keywords(s):  
Category(s): Technology Classifications > Engineering > Computer Science
Hardware Trojan Detection Tool for Integrated Circuits
Identifies Hardware Trojans using Scanning Electron Microscope Image ProcessingThis software is a tool to identify hardware Trojans present in integrated circuits (IC’s) by analyzing scanning electron microscope (SEM) images. A hardware Trojan is an intentional modification of an IC to leak valuable data or to disable the chip or its components....
Published: 1/20/2026   |   Inventor(s): Mark Tehranipoor, Navid Asadi-Zanjani, Damon Woodard, Mir Rahman, Haoting Shen, Nidish Vashistha
Keywords(s): Hardware Security, Hardware Trojan, Hardware Trust, Image Processing, Reverse Engineering
Category(s): Technology Classifications > Engineering > Electrical