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Search Results - marius+orlowski
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Enhanced ReRAM Architecture with Optimized Thermal Management and Improved Cell Reliability
THE CHALLENGE One of the major challenges facing Resistive Random Access Memory (ReRAM) technology lies in managing the intense heat generated during its operation, particularly during the reset phase of memory switching. This heat, caused by Joule heating, not only degrades the performance of individual memory cells by reducing their ability to clearly...
Published: 9/8/2025
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Inventor(s):
Marius Orlowski
,
Mohammad Shah Al-Mamun
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Category(s):
Technology Classifications > Electronics