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Scanning Tunneling Microscope (STM) Algorithm That Increases Accuracy of Scan Results
Requires No Additional Hardware, Determines Accurate Position of Atoms on Material’s Surface By Combining Multiple Scans This algorithm combines multiple scans from a scanning tunneling microscope to reduce or eliminate errors in individual scans without any hardware upgrades. Scanning tunneling microscopes are electron microscopes that show 3D...
Published: 6/27/2021   |   Inventor(s): Yunmei Chen, Xiaoguang Zhang, Hao Zhang, Xianqi Li
Keywords(s): Image Analysis, Image Processing, Image Registration, microscopy
Category(s): Technology Classifications > Engineering > Instrumentation-Sensors-Photonics, Technology Classifications > Research Tools