Search Results - dragan+djurdjanovic

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Rapid optical metrology of critical dimensions of large-area nanostructure arrays with complex patterns
Background Scatterometry-based metrology has the capability to perform high-throughput inspection of geometric characteristics of large-area nanopatterned surfaces. It utilizes physics-based dependencies between reflectance of light scattered from nanopatterned surfaces for pre-defined set of wavelengths and Critical Dimensions (CDs) of such nanopatterns. Current...
Published: 8/16/2024   |   Inventor(s): Dragan Djurdjanovic, Ramin Sabbagh
Keywords(s):  
Category(s): Physical sciences > Semiconductor, Physical sciences > Testing equipment, Computer > Algorithms and software methods, Computer > AI/ML
Software for signal segmentation and extraction of informative time-domain features
Background Industrial manufacturing equipment equipped with large numbers of sensors is commonplace in today’s modern manufacturing systems. From Smart Factories using AI and digital twins, along with the proliferation of the Internet of Things (IoT) to improve efficiency and productivity, one common challenge is what to do with the vast amounts...
Published: 3/18/2024   |   Inventor(s): Dragan Djurdjanovic, Roberto Dailey
Keywords(s):  
Category(s): Physical sciences > Semiconductor, Software