Inteum Company
Links
seedsprint
Visible Legacy
RSS
News & Resources
Inteum Company News
Inteum Library
Subscribe
Search Results - deflectometry
3
Results
Sort By:
Published Date
Updated Date
Title
ID
Descending
Ascending
Method for Three-Dimensional Surface Measurement with a Mobile Device
NU 2019-101 INVENTORS Oliver Cossairt* Vikas Gupta Florian Schiffers William Spies Marc Walton Florian Willomitzer Chia Kai Yeh SHORT DESCRIPTION This technology offers a method and system for performing three-dimensional
Deflectometry
measurements of specular surfaces using only a mobile device, eliminating the need for offline calibration...
Published: 2/28/2025
|
Inventor(s):
Keywords(s):
3D imaging
,
Deflectometry
,
Imaging
Category(s):
Physical Sciences > Engineering & Technology
Software Configurable Optical Test System (SCOTS)
Researchers at the University of Arizona have developed a system for testing the figure and finish of optical surfaces or any other curved surface using a Shack-Hartmann type of method, wherein a pattern can be projected onto the surface and then its returned image can be analyzed. The patterns can be varied to optimize the returned information regarding...
Published: 2/12/2025
|
Inventor(s):
Peng Su
,
James Burge
,
Robert Parks
,
James Angel
Keywords(s):
aspheric surface
,
deflectometry
,
free from surface
,
Hartmann test
,
solar mirror
Category(s):
Technology Classifications > Imaging & Optics
,
Technology Classifications > Imaging & Optics > Optical Fab / Metrology
Software for SCOTS (Software Configurable Optical Test System)
Researchers at the University of Arizona have developed a system for testing the figure and finish of optical surfaces or any other curved surface using a Shack-Hartmann type of method, wherein a pattern can be projected onto the surface and then its returned image can be analyzed. The patterns can be varied to optimize the returned information regarding...
Published: 4/3/2023
|
Inventor(s):
Peng Su
,
James Burge
Keywords(s):
deflectometry
,
Hartmann test
Category(s):
Technology Classifications > Imaging & Optics
,
Technology Classifications > Imaging & Optics > Optical Fab / Metrology