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Search Results - asher+leff
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Strain Mapping in TEM Using Precession Electron Diffraction
PAGE TITLE Overview PAGE SUMMARY A sample material is scanned with a transmission electron microscope (TEM) over multiple steps having a predetermined size at a predetermined angle. Each scan at a predetermined step and angle is compared to a template, wherein the template is generated from parameters of the material and the scanning. The data...
Published: 8/12/2024
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Inventor(s):
Mitra Taheri
,
Asher Leff
Keywords(s):
Category(s):
Materials & Chemicals
,
Materials & Chemicals > M-C: Chemicals and Processes
,
Materials & Chemicals > M-C: Metallurgy