PAGE TITLE
Overview
PAGE SUMMARY
A sample material is scanned with a transmission electron microscope (TEM) over multiple steps having a predetermined size at a predetermined angle. Each scan at a predetermined step and angle is compared to a template, wherein the template is generated from parameters of the material and the scanning. The data is then analyzed using local mis-orientation mapping and/or Nye's tensor analysis to provide information about local strain states.
IP STATUS
Intellectual Property and Development Status
United States Issued Patent- 9,568,442
https://patents.google.com/patent/US9568442B2/en?oq=9%2c568%2c442
Commercialization Opportunities
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Contact Information
For Intellectual Property and Licensing Information:
Elizabeth Poppert, Ph.D.
Licensing Manager
Phone: 1-215-895-0999
Email: lizpoppert@drexel.edu