The Problem:
For portal imaging at MeV energies, electronic portal imaging devices (EPIDs) based on indirect flat panel detector (I-FPD) technology, as depicted below, have become standard. The highest-performing I-FPDs that are currently available have very low (~1%) detective quantum efficiency (DQE) performance at MeV energies. This limitation is due to a large fraction of x-rays passing through the scintillating x-ray conversion layer undetected.
The Solution:
Researchers at the University of Tennessee and Stony Brook University have invented a novel structured x-ray scintillating material for I-FPDs, as shown below. This material greatly increases the DQE of the systems by utilizing x-rays that otherwise would go undetected. The structured nature of the material mitigates light scattering and allows for thicker, more absorbing materials.
INVENTORS: