USF inventors have developed a technique, with two NVFFs, which offers fast data storage and restoration from intentional and unintentional power outages. The two NVFFs are capable of backing up data per cycle while maintaining a moderately long delay. The design also eliminates the need for an external control and driver circuitry. Furthermore, the technology also analyzes the effect of supply voltage scaling and the impact of static leakage power. Compared to existing techniques, this technology incorporates enhanced testing capability for the delays. Additionally, by using data-dependent power gating, the device mitigates high static current during retention. Thus, this invention demonstrates an excellent alternative to present day flip-flop based storage elements which neither have power gating nor other test capabilities.
Demonstrating How Power Gating Helps Cut Down Unnecessary Static Power Efficiently