Modular Scanning Probe Microscopy (SPM) Head and Compact UHV Probe Transfer System

Connection of STM head to transfer mechanism in RT chamber


Invention Summary:

Traditional scanning probe microscopy (SPM) systems face a range of significant technical and operational challenges that hinder performance and flexibility. Rigid, hard-wired connections restrict head configurations, while probe transfers between chambers risk compromising vacuum integrity. Large instrument footprints and cumbersome navigation systems make operation in confined ultra-high vacuum (UHV) and high magnetic field environments particularly difficult. Cryogen-free STM setups are further hampered by pulse tube-induced vibrations that degrade imaging quality, and conventional large vertical translation stages add maintenance burden, higher operating costs, and extended pump-down times. The lack of multi-modal capability within a single instrument limits experimental versatility, while vacuum leaks and dead space introduced during probe translation create additional inefficiencies that slow research progress.

Rutgers inventors have developed a novel modular SPM head featuring a unique weak spring and pin electrical connection system that allows easy mechanical and electrical coupling. This design supports in situ switching among scanning tunneling microscopy (STM), atomic force microscopy (AFM), and magnetic force microscopy (MFM) modes and facilitates transfer between atmospheric pressure, UHV chambers, and cryogenic or high magnetic field environments without breaking vacuum. The compact probe transfer mechanism replaces bulky traditional translation stages with a small-footprint, flexible design that shuttles probes between spatially separated sites within UHV systems, significantly reducing system size, pump down times, and leakage risks while improving measurement precision under demanding experimental conditions.

Market Applications:

  • Advanced materials & nanotechnology labs requiring compact, modular, multi-modal SPM solutions.
  • Low-temperature, high magnetic field & cryogen-free research facilities demanding atomic-resolution STM imaging.
  • Quantum materials & surface science research requiring precise, reliable probe exchange in controlled environments.
  • Academic, industrial R&D & cryogenic instrumentation manufacturers seeking flexible, vibration-sensitive SPM upgrades.

Advantages:

  • Modular plug-and-play design enables flexible multi-modal integration across multiple UHV systems, supporting effortless switching between STM, AFM, and MFM without breaking vacuum.
  • Compact all-in-one architecture integrates movement and vibration isolation into a reduced footprint, enabling atomic-resolution STM imaging in cryogen-free cryostats.
  • Enhanced reliability and stability through automatic height locking, separate vacuum seals, and real-time sensors minimizing experimental disruptions.

Publications:

Intellectual Property & Development Status:   Issued U.S. patents: US12098026B2, US11474127B2, US12360136B2. Pending U.S. divisional application: US20250033878A1.  Pending U.S. non-provisional application. Available for licensing and/or research collaboration. For any business development and other collaborative partnerships, contact:  marketingbd@research.rutgers.edu

Patent Information: