Researchers at the University of Arizona have developed a super-resolution microscopy method that is faster, easier to use, and has less artifacts than current super-resolution methods. The result is a 3D dual-color stimulated emission depletion (STED) nonlinear structured illumination (NL-SIM) microscope. Using a combination of low coherent light and time-gated detection, the microscope has improved lateral and axial resolution.
Background: Current super-resolution microscopy allows live 3D imaging of cellular processes at tens of nanometer resolution, but lacks super-resolution in the axial dimension. The systems are also complex and carry a high risk of artifacts. There is a need in the art for greater axial resolution, and a system that is easier to use with high quality results.
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Status: Issued U.S. Patent #10,914,930