Measuring Ion Concentration as a Stability Metric in Perovskite Semiconductors

Perovskite materials, especially hybrid metal halide perovskite (MHP), have garnered significant attention because of their potential in the field of solar cells. However, the further development of perovskite materials has been plagued by their stability challenges. Because of the “soft” ionic nature of the lattice while being brittle and unable to plastically deform, 3D MHP materials are highly susceptible to light, heat, moisture, oxygen, delamination, and electric field. More importantly, because of the relatively weak binding energy between the cations and anions in the lattice, ion migration remains one of the primary degradation pathways.

 

Researchers at Arizona State University have developed a novel method utilizing mobile ion concentration (N₀) as a metric to determine the stability, longevity, and thermal durability of perovskite solar cells by mitigating ion migration through engineered electrode barriers. The method provides a universal operational threshold linked to N₀ concentration, enabling improved reliability and manufacturing quality control for perovskite-based electronic devices. This extends well beyond photovoltaic devices to any solid-state material that contains mobile ions.

 

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