Inventors at USF have developed a direct measurement method that is capable of characterizing the full transverse field profile of fully-polarized vector beams. The direct measurement process involves a separation of orthogonal polarization components, a weak polarization perturbation, and a polarization resolving imaging process. Polarization information provides a robust and versatile metrology tool for fundamental studies of vector beams and a wide spectrum of applications utilizing vector beams, including microscopy, surveillance, communication and imaging.
The Measured Phase of the Two Circular Polarization Components