VAlue proposition
The present technology is a method and apparatus for measuring the performance of industrial ultrashort‑pulse, diode‑pumped lasers. While these lasers are widely used in high‑power, high‑repetition‑rate applications, users have observed that systems with identical published specifications often deliver very different processing results. This demonstrates that conventional metrics—pulse duration, repetition rate, and average power—do not fully characterize laser performance. Existing diagnostic methods measure total integrated power or rely on nonlinear techniques that cannot reliably distinguish energy within pulses from power between pulses. Because background energy and pulse degradation place significant stress on optical components and directly affect processing quality, a reliable means of measuring laser behavior between pulses is needed to detect performance changes and maintain optimal system operation.
Description of Technology
This technology delivers a novel diagnostic solution for industrial ultrashort‑pulse lasers by measuring energy emitted between laser pulses—a critical performance factor that conventional specifications fail to capture. While lasers may share identical published specs (pulse duration, repetition rate, average power), they often produce very different results in real‑world manufacturing. The root cause is unmanaged background energy and pulse degradation, which reduce processing quality and accelerate wear on optical components. This technology directly addresses that gap. At its core is a Power Figure of Merit (PFM), a quantitative metric that reports what fraction of a laser’s total output occurs between pulses rather than within them. Using synchronized photon‑counting detectors and fast timing electronics, the system independently measures in‑pulse and inter‑pulse energy, enabling precise detection of noise, instability, and performance drift. PFM completes laser characterization and provides actionable insight across the laser lifecycle. By revealing previously invisible performance characteristics, this technology improves yield, protects optical components, and ensures consistent, high‑quality laser processing.
Benefits
Applications
IP Status
US11,385,098
LICENSING RIGHTS AVAILABLE
Full licensing rights available
INVENTORs: Dr. Marcos Dantus
Tech ID: TEC2020-0099