Dual-Path Optical Measurement System with Integrated Pupil and FOV Scanning

This technology is a compact optical measurement system designed to test and evaluate head-mounted displays used in augmented, virtual, and mixed reality. The system captures both wide field-of-view images and fine image detail at the same time by splitting light into two coordinated measurement paths. A shared entrance pupil and integrated scanning allow the system to simulate how the human eye views near-eye displays. By combining wide-angle imaging with a high-resolution measurement path in a single setup, the system reduces the need for multiple cameras, repeated alignment, or large mechanical scanning stages. This enables faster, more repeatable, and more accurate testing of modern near-eye display optics in both research and production environments.

Background: 
As AR, VR, and MR headsets become more advanced, testing their optical performance has become harder. These devices use wide fields of view, large eyeboxes, and complex optics that are difficult to measure with standard camera systems. Many existing measurement tools rely on a single optical path, which forces a compromise between wide coverage and fine detail. Others depend on bulky motion stages or multiple camera modules that increase cost and reduce repeatability. This system addresses these problems by integrating pupil scanning and field-of-view scanning into a single dual-path optical design. This allows accurate simulation of eye position while capturing both global and detailed image performance without changing hardware or repositioning the device under test.

Applications: 

  • Optical testing of AR headsets
  • Optical testing of VR and MR headsets
  • Display calibration and quality control
  • Research and development of near-eye optics
  • Manufacturing inspection systems


Advantages: 

  • Simultaneous wide-field and high-resolution measurement
  • Compact architecture integrating a shared entrance pupil for accurate eye simulation
  • Reduced system size compared to multi-camera setups
  • Improved measurement repeatability
  • Lower alignment time and testing complexity
Patent Information: