A compact echelle spectrometer using freeform optics for high-resolution, UV spectral imaging with minimized optical aberrations
Institute Reference: 2-17028
Atomic spectroscopy relies on precise wavelength selection to determine the concentration of specific elements in a sample. Conventional spectrometers face trade-offs between high resolution, optical throughput, and compactness. Existing echelle spectrometers using two-dimensional detectors offer flexibility but often sacrifice one or more key performance aspects, such as spectral coverage or resolution, especially when used with solid-state detectors.
This compact echelle spectrometer integrates a slit opening, a collimator, an echelle grating for primary dispersion, a cross-disperser, and a sophisticated imaging system. The imaging system comprises three tilted mirrors—primary, secondary, and tertiary—that utilize freeform, rotationally non-symmetric surface shapes. These freeform optics correct optical aberrations introduced by tilting the mirrors, ensuring high-resolution imaging over a wide spectral range, specifically targeting UV light from 160 to 400 nm. The system is designed to be compact, fitting within a 9.5-liter volume while maintaining an unobscured light path and operating in the picometer-class spectral resolution.
The compact echelle spectrometer offers several key benefits that make it a versatile and powerful tool for spectroscopy applications. It achieves high spectral resolution by employing echelle gratings at higher diffraction orders, which significantly enhances its resolving power. Its compact design allows it to fit into a small volume, making it ideal for portable uses or space-constrained environments.
The use of freeform optics helps to minimize optical aberrations, resulting in high optical throughput and improved image quality. Additionally, the system is optimized to reduce stray light, particularly in the UV range, which enhances its effectiveness in sensitive atomic spectroscopy applications. The spectrometer also features versatile detector compatibility, being designed to work seamlessly with multichannel solid-state detectors, such as CMOS-based sensors, enabling simultaneous monitoring of multiple wavelengths.
This compact echelle spectrometer has a wide range of applications across multiple fields. In atomic emission spectroscopy (AES) it provides high-resolution element analysis, making it a valuable tool in both laboratory research and industrial settings. In environmental monitoring, it is used to detect trace elements in various environmental samples, such as water, soil, and air, helping to assess pollution levels and ensure regulatory compliance.
In the industrial sector, the spectrometer plays an important role in quality control by monitoring impurities in manufacturing processes, particularly in the semiconductor and metallurgy industries, where precise material composition is critical. Additionally, in the medical field, the spectrometer can be used for the detection of trace metals in biological samples, supporting medical research and diagnostics through accurate and sensitive measurement.
The University of Rochester is open to exploring funded research collaborations, licensing agreements, and other partnership opportunities.