A Multi-Functional Three-Dimensional Microscopic System with Structured Illumination and Optical Depth Scanning

This technology is a telecentric microscope design that reconciles the resolution vs. depth of field issues associated with microscope systems. The microscope's design maintains constant system magnification while it performs a depth scan with an electrically controlled vari-focal lens. 

Background:
The classic tradeoff between optical resolution and depth of field in microscopy forces a conventional system to take measurements at different depths and then reconstruct three-dimensional data for an extended depth of field (EDOF), a time-consuming process due to the limited speed of mechanical movement and complexity of data extraction.

Applications:

• High-performance freeform optics metrology
• Biomedical imaging

Advantages:

• Achieves high resolution and depth of field information
• Supports multiple imaging modalities
• Addresses the limitations of conventional microdeflectometry and EDOF

Status: issued U.S. patent #10,725,279