A High Speed Energy-Efficient Anti-Ferromagnetic Memory Device

NU 2018-117

 

INVENTOR

Pedram Khalili Amiri

 

SHORT DESCRIPTION

A high speed, energy-efficient anti-ferromagnetic voltage-controlled memory device with high density storage capabilities

 

BACKGROUND

A surge in data mining across industries has propelled a growing demand in developing efficient, cost-effective and reliable high density storage solutions for IoT and cloud computing. Existing market solutions are either too slow (NAND Flash) or too expensive (SRAM, requiring large area/bit or DRAM, with complex processing). Hence, Magnetic memory devices (MRAM) have become industry leaders in this space owing to their non-volatility and high endurance. However, their dependence on ferromagnetic materials compromises reliability in compact devices and use of electric current in writing information, results in heat generation and low writing speeds. Thus there is a critical need for technologies that address these limitations.

 

ABSTRACT

Northwestern researchers have invented an antiferromagnetic voltage-controlled memory (AVM) device. The value proposition of the invention lies in the utilization of an energy efficient method of writing information into the memory device using a voltage controlled mechanism. Using this principle, the researchers have successfully demonstrated in a prototype, significantly diminished speed of writing in the order of picoseconds, ensuring information storage at high densities and securing reliability. This is a first in class technology, utilizing antiferromagnetic material for memory storage that advances the prospects of device security and performance incrementally, in a scalable device.

 

APPLICATIONS

  • Embedded memory in processor chips
  • Random Access Memory (RAM) in computers, smartphones and servers
  • Wearable devices
  • Machine learning accelerators
  • Automotive

 

ADVANTAGES

  • 100x faster than existing technology on the market
  • 20x energy-efficient over current devices
  • Improved scalability to devices below the 20 nm dimension
  • Better security and lower packaging costs owing to protection against external magnetic fields

 

PUBLICATIONS

Lopez-Dominguez V, Almasi H and Amiri PK (2019) Picosecond Electric-Field-Induced Switching of Antiferromagnets.  Physical Review Applied. 11: 024019.

 

IP STATUS

Provision and PCT applications have been filed.

 

 

Antiferromagnetic voltage-controlled memory device consiting of an AFM layer in proximity to a dielectric film.

 

Patent Information: