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System and Method for Online End Point Detection for Use in Chemical Mechanical Planarization
Inventors at USF have developed a system and method for identifying a significant event in a CMP process. This novel method uses a sequential probability ratio test on the wavelet decomposed coefficient of friction (CoF) data from the CMP process. The method is made suitable for online application by developing a moving block data processing strategy,...
Published: 7/17/2024   |   Inventor(s): Tapas Das, Rajesh Ganesan, Ashok Kumar, Arun Sikder
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Category(s): Technology Classifications > Electronics