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Search Results - justin+taraska
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Instant Total Internal Reflection Fluorescence/Structured Illumination Microscopy (instant TIRF/SIM)
This technology includes a method which enables high-speed, super-resolution microscopy at a very high signal-to-noise ratio (SNR), for biological applications within ~200 nm (the evanescent wave decay length) of a coverslip surface. Instant TIRF/SIM may be implemented simply by modifying and adding to the excitation optics that are already present...
Published: 8/12/2024
|
Inventor(s):
Hari Shroff
,
Justin Taraska
,
Abhishek Kumar
,
Min Guo
Keywords(s):
Category(s):
Application > Research Materials
,
Collaboration Sought > Licensing
,
ResearchProducts > Research Equipment