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Microlens Amplitude Masks for Flying Pixel Removal in Time-of-Flight Imaging
Microlens Amplitude Masks for Flying Pixel Removal in Time-of-Flight Imaging Princeton Docket # 21-3789 Flying Pixels (FPs) are common artifacts in time-of-flight (ToF) imaging that arise at object boundaries, where light from both foreground and background is mixed, leading to inaccurate depth measurements and negatively impacting 3D vision tasks....
Published: 11/4/2024   |   Inventor(s): Felix Heide, Ilya Chugunov, Seung-Hwan Baek, Qiang Fu, Wolfgang Heidrich
Keywords(s):  
Category(s): Mechanical/Electrical Engineering