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Search Results - ekua+bentil
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Rapid and Minimally Invasive Quantum Cascade Wafer Testing
Princeton University Invention # 09-2523 Quantum Cascade (QC) wafer quality testing requires intensive processing and characterization. Conventional techniques used for wafer quality testing include photoluminescence, x-ray diffraction, Hall effect measurements, high resolution x-ray diffraction, transmission electron microscopy and secondary...
Published: 3/30/2022
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Inventor(s):
Claire Gmachl
,
Ekua Bentil
Keywords(s):
Category(s):
Mechanical/Electrical Engineering