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STFC has developed a novel ionising particle analyser which enables the separation of the fluorescent yield and electron yield in EXAFS (extended X-ray absorption fine structure) measurements. The technology greatly improves the study of surface layers of materials using X-ray light sources. DESCRIPTIONMeasurement of electron yield is a known technique...

Published: 6/8/2022 | Inventor(s): Edward Bateman, Gareth Ernest Derbyshire

Keywords(s): 01.h. Imaging & Detector Technology, 03.c. Apparatus Engineering, 05.b. Chemistry, 05.f. Physics, 05.f1 Accelerators, 05.f2 Light Sources, 06.b. Biology/Biotechnology, 09.a. Measurement Tools

Category(s): Advanced Materials, NDT, Scientific Instrumentation, Sensors & detectors, Pharmaceuticals & Biologics