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System and Method for Estimating the Magnetization States of a Nano-Magnet Array
Competitive Advantages Automated & less error prone analysis Fast analysis of fabrication quality Estimation of magnetization states Sensitivity up to 5nm defects Summary The software suite developed by our inventors consists of two main systems: an automated defect inspection system and a nanostructure state estimation system. The automated...
Published: 8/27/2023   |   Inventor(s): Dinuka Karunaratne, Sanjukta Bhanja, Sudeep Sarkar, Ravi Panchumarthy
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Category(s): Technology Classifications > Electronics, Technology Classifications > Electronics > Electronics Laser