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Search Results - darrick+hay
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Measurement Apparatus of Wavefront and Polarization Profile of Vectorial Optical Fields
Competitive Advantages High data fidelity Versatile metrology tool Full characterization of vector beams Equally suited for classical and quantum regimes Summary Inventors at USF have developed a direct measurement method that is capable of characterizing the full transverse field profile of fully-polarized vector beams. The direct measurement...
Published: 7/6/2023
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Inventor(s):
Zhimin Shi
,
Darrick Hay
,
Ziyi Zhu
,
Yiyu Zhou
,
Robert Boyd
Keywords(s):
Category(s):
Technology Classifications > Electronics > Electronics Laser
,
Technology Classifications > Electronics